Investigation of Long-Term SPI NOR Flash Timing Behavior

• Typ der Arbeit: Bachelor-/Masterarbeit
• Status der Arbeit: offen
• Betreuer: Yannick Loeck

Basic Tasks:

• pick out at least 5 different SPI NOR flash chips
• identify their theoretical timing from the datasheet and SFDP table
• develop a portable test bench
• benchmark/stress test the chips to identify real timing, and compare

Timing Parameters:

• byte up to page read, continuous read if applicable
• byte up to page write, continuous write if applicable
• sector (and larger block if applicable) erase
• chip erase

Parameter Space:

• chip fill level
• data patterns
• cell wear
• temperature
• on-chip ECC?
• voltage